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A guide to analysis and reconstruction of serial block face scanning electron microscopy data
Serial block face scanning electron microscopy (SBF‐SEM) is a relatively new technique that allows the acquisition of serially sectioned, imaged and digitally aligned ultrastructural data. There is a wealth of information that can be obtained from the resulting image stacks but this presents a new c...
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| Publicado no: | J Microsc |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
John Wiley and Sons Inc.
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5947172/ https://ncbi.nlm.nih.gov/pubmed/29333754 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12676 |
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