Llwytho...

Challenges of microtome‐based serial block‐face scanning electron microscopy in neuroscience

Serial block‐face scanning electron microscopy (SBEM) is becoming increasingly popular for a wide range of applications in many disciplines from biology to material sciences. This review focuses on applications for circuit reconstruction in neuroscience, which is one of the major driving forces adva...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:J Microsc
Prif Awduron: WANNER, A. A., KIRSCHMANN, M. A., GENOUD, C.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: John Wiley and Sons Inc. 2015
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC4745002/
https://ncbi.nlm.nih.gov/pubmed/25907464
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12244
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