טוען...
Challenges of microtome‐based serial block‐face scanning electron microscopy in neuroscience
Serial block‐face scanning electron microscopy (SBEM) is becoming increasingly popular for a wide range of applications in many disciplines from biology to material sciences. This review focuses on applications for circuit reconstruction in neuroscience, which is one of the major driving forces adva...
שמור ב:
| הוצא לאור ב: | J Microsc |
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| Main Authors: | , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
John Wiley and Sons Inc.
2015
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4745002/ https://ncbi.nlm.nih.gov/pubmed/25907464 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12244 |
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