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Challenges of microtome‐based serial block‐face scanning electron microscopy in neuroscience
Serial block‐face scanning electron microscopy (SBEM) is becoming increasingly popular for a wide range of applications in many disciplines from biology to material sciences. This review focuses on applications for circuit reconstruction in neuroscience, which is one of the major driving forces adva...
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| Опубликовано в: : | J Microsc |
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| Главные авторы: | , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
John Wiley and Sons Inc.
2015
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4745002/ https://ncbi.nlm.nih.gov/pubmed/25907464 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12244 |
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