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Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films
Transparent conductive IWO/Cu/IWO (W-doped In<sub>2</sub>O<sub>3</sub>) films were deposited on quartz substrates by magnetron sputtering of IWO and Cu in the Ar atmosphere. The X-ray diffraction (XRD) patterns identified the cubic iron−manganese ore crystal structu...
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| Autors principals: | , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2019-12-01
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| Col·lecció: | Materials |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/1996-1944/13/1/113 |
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