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Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films
Transparent conductive IWO/Cu/IWO (W-doped In(2)O(3)) films were deposited on quartz substrates by magnetron sputtering of IWO and Cu in the Ar atmosphere. The X-ray diffraction (XRD) patterns identified the cubic iron–manganese ore crystal structure of the IWO layers. The influence of the thickness...
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| Publicado no: | Materials (Basel) |
|---|---|
| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6982096/ https://ncbi.nlm.nih.gov/pubmed/31881786 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma13010113 |
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