Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films

Transparent conductive IWO/Cu/IWO (W-doped In<sub>2</sub>O<sub>3</sub>) films were deposited on quartz substrates by magnetron sputtering of IWO and Cu in the Ar atmosphere. The X-ray diffraction (XRD) patterns identified the cubic iron&#8722;manganese ore crystal structu...

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Auteurs principaux: Fengbo Han, Wenyuan Zhao, Ran Bi, Feng Tian, Yadan Li, Chuantao Zheng, Yiding Wang
Format: Artigo
Langue:Inglês
Publié: MDPI AG 2019-12-01
Collection:Materials
Sujets:
multilayer
thin film
transparent conductive
Accès en ligne:https://www.mdpi.com/1996-1944/13/1/113
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