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Synthesizing Industrial Defect Images Under Data Imbalance

Defect detection is a crucial technology in the industry that enhances production efficiency within the manufacturing sector. However, obtaining a balanced dataset with sufficient samples of both normal and defect is often challenging and time-consuming. Constructing an unbalanced dataset skewed tow...

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Bibliografische Detailangaben
Hauptverfasser: Eunhee Cho, Byeonghwan Jeon, In Kyu Park
Format: Artigo
Sprache:Inglês
Veröffentlicht: IEEE 2023-01-01
Schriftenreihe:IEEE Access
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Online-Zugang:https://ieeexplore.ieee.org/document/10274069/
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