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Synthesizing Industrial Defect Images Under Data Imbalance

Defect detection is a crucial technology in the industry that enhances production efficiency within the manufacturing sector. However, obtaining a balanced dataset with sufficient samples of both normal and defect is often challenging and time-consuming. Constructing an unbalanced dataset skewed tow...

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Xehetasun bibliografikoak
Egile Nagusiak: Eunhee Cho, Byeonghwan Jeon, In Kyu Park
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: IEEE 2023-01-01
Saila:IEEE Access
Gaiak:
Sarrera elektronikoa:https://ieeexplore.ieee.org/document/10274069/
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