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Review of Edge Detection Algorithms for Application in Miniature Dimension Measurement Modules

The constant improvements in the technology of semiconductor chips allow increasingly complex functionality to be performed by more and more space and power limited modules. Deep miniaturisation and cost reduction of such modules have positive influence on their application areas. They can be used e...

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Bibliografische gegevens
Hoofdauteurs: Grzegorz Budzyn, Janusz Rzepka
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Publishing House of Wrocław Board of Scientific Technical Societies Federation NOT 2020-11-01
Reeks:Journal of Machine Engineering
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Online toegang:http://jmacheng.not.pl/Review-of-Edge-Detection-Algorithms-for-Application-in-Miniature-Dimension-Measurement,130876,0,2.html
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