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Exploring the Beam Squint Effects on Reflectarray Performance: A Comprehensive Analysis of the Specular and Scattered Reflection of the Unit Cell

In this article, the phenomena of beam deviation in reflectarray is discussed. The radiation pattern of the unit cell, which plays a vital role in shaping the beam of the reflectarray, is analyzed by considering undesired specular and scattered reflections. These unwanted reflections adversely affec...

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Detaylı Bibliyografya
Asıl Yazarlar: Manzoor Elahi, Amir Altaf, Slawomir Koziel, Anna Pietrenko-Dabrowska
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: MDPI AG 2024-02-01
Seri Bilgileri:Sensors
Konular:
Online Erişim:https://www.mdpi.com/1424-8220/24/5/1438
Etiketler: Etiketle
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