Exploring the Beam Squint Effects on Reflectarray Performance: A Comprehensive Analysis of the Specular and Scattered Reflection of the Unit Cell
In this article, the phenomena of beam deviation in reflectarray is discussed. The radiation pattern of the unit cell, which plays a vital role in shaping the beam of the reflectarray, is analyzed by considering undesired specular and scattered reflections. These unwanted reflections adversely affec...
Tallennettuna:
| Päätekijät: | , , , |
|---|---|
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
MDPI AG
2024-02-01
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| Sarja: | Sensors |
| Aiheet: | |
| Linkit: | https://www.mdpi.com/1424-8220/24/5/1438 |
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