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Characterization of Defects in GaN: Optical and Magnetic Resonance Techniques

GaN and its alloys with InN and AlN are of technological importance for a variety of optical, electronic, and optoelectronic devices due to its high thermal conductivity, wide band gap, high breakdown voltage and high saturation velocity. GaN-based devices now provide superior performance for a vari...

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Principais autores: Jaime A. Freitas, James C. Culbertson, Evan R. Glaser
格式: Artigo
語言:Inglês
出版: MDPI AG 2022-09-01
叢編:Crystals
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在線閱讀:https://www.mdpi.com/2073-4352/12/9/1294
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