Construction and application of march tests for pattern sensitive memory faults detection

The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbi...

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מידע ביבליוגרפי

Principais autores:	V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets, I. Mrozek
פורמט:	Artigo
שפה:	Russo
יצא לאור:	National Academy of Sciences of Belarus, the United Institute of Informatics Problems 2021-03-01
סדרה:	Informatika
נושאים:	testing of computer systems storage devices march tests of memory multiple testing coupon collector problem
גישה מקוונת:	https://inf.grid.by/jour/article/view/1117
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