Analysis and Synthesis March Memory Tests
The paper shows the relevance of testing storage devices in modern computing systems. Mathematical models of memory device faults and the efficiency of their detection, in particular, complex pattern sensitive faults of the PNPSFk type, based on classical march memory tests are presented. Limit esti...
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| Asıl Yazarlar: | , , |
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| Materyal Türü: | Artigo |
| Dil: | Russo |
| Baskı/Yayın Bilgisi: |
Ministry of Education of the Republic of Belarus, Establishment The Main Information and Analytical Center
2021-07-01
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| Seri Bilgileri: | Цифровая трансформация |
| Konular: | |
| Online Erişim: | https://dt.giac.by/jour/article/view/612 |
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