Construction and application of march tests for pattern sensitive memory faults detection
The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbi...
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| Hauptverfasser: | , , , |
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| Format: | Artigo |
| Sprache: | Russo |
| Veröffentlicht: |
National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2021-03-01
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| Schriftenreihe: | Informatika |
| Schlagworte: | |
| Online-Zugang: | https://inf.grid.by/jour/article/view/1117 |
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