PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1
Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-...
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| Auteurs principaux: | , , |
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| Format: | Artigo |
| Langue: | Russo |
| Publié: |
National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2018-03-01
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| Collection: | Informatika |
| Sujets: | |
| Accès en ligne: | https://inf.grid.by/jour/article/view/321 |
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