An Efficient and Intelligent Detection Method for Fabric Defects based on Improved YOLOv5
Limited by computing resources of embedded devices, there are problems in the field of fabric defect detection, including small defect size, extremely unbalanced aspect ratio of defect size, and slow detection speed. To address these problems, a sliding window multihead self-attention mechanism is p...
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| Autori principali: | , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
MDPI AG
2022-12-01
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| Serie: | Sensors |
| Soggetti: | |
| Accesso online: | https://www.mdpi.com/1424-8220/23/1/97 |
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