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An Efficient and Intelligent Detection Method for Fabric Defects based on Improved YOLOv5

Limited by computing resources of embedded devices, there are problems in the field of fabric defect detection, including small defect size, extremely unbalanced aspect ratio of defect size, and slow detection speed. To address these problems, a sliding window multihead self-attention mechanism is p...

Ausführliche Beschreibung

Gespeichert in:
Hauptverfasser: Guijuan Lin, Keyu Liu, Xuke Xia, Ruopeng Yan
Format: Artigo
Sprache:Inglês
Veröffentlicht: MDPI AG 2022-12-01
Schriftenreihe:Sensors
Schlagworte:
deep learning
computer vision
fabric detection
Swin Transformer
YOLOv5
Online-Zugang:https://www.mdpi.com/1424-8220/23/1/97
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