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FPGA-based reconfigurable scanning and data acquisition system for scanning electron microscopy

Abstract We present an FPGA-based reconfigurable scanning and data acquisition system for scanning electron microscopy (SEM). Built on the Xilinx Artix-7 (XC7A35T), the system integrates dual-channel 14-bit DAC raster scan waveform generation, dual-channel 12-bit ADC signal acquisition with on-chip...

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Hoofdauteurs: Kyubin Gong, Junseok Kim, Bog G. Kim, Boklae Cho
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: SpringerOpen 2026-05-01
Reeks:Applied Microscopy
Onderwerpen:
FPGA
Scanning electron microscopy
Data acquisition
Raster scan
Real-time synchronization
Signal-to-noise ratio
Online toegang:https://doi.org/10.1186/s42649-026-00137-7
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