Development of a method for analyzing the positional correlation of local structures in scanning probe microscopy images using template-matching image-processing method

The functionalities of materials are governed by the atom type and arrangement, and perturbations caused by defects and adsorbate interactions often significantly alter the behavior of materials. Scanning probe microscopy (SPM) can capture complex interactions caused by the structures on surfaces. I...

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Autors principals:	Sota Tsubokura, Shoya Kawano, Yumiko Imai, Tadashi Ueda, Kei-ichi Nakamoto, Haruo Noma, Hirohisa Hioki, Taketoshi Minato
Format:	Artigo
Idioma:	Inglês
Publicat:	IOP Publishing 2024-01-01
Col·lecció:	Applied Physics Express
Matèries:	scanning probe microscopy atomic force microscopy scanning tunneling microscopy surface interface image processing
Accés en línia:	https://doi.org/10.35848/1882-0786/ad2784
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