Development of a method for analyzing the positional correlation of local structures in scanning probe microscopy images using template-matching image-processing method

The functionalities of materials are governed by the atom type and arrangement, and perturbations caused by defects and adsorbate interactions often significantly alter the behavior of materials. Scanning probe microscopy (SPM) can capture complex interactions caused by the structures on surfaces. I...

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書誌詳細

主要な著者:	Sota Tsubokura, Shoya Kawano, Yumiko Imai, Tadashi Ueda, Kei-ichi Nakamoto, Haruo Noma, Hirohisa Hioki, Taketoshi Minato
フォーマット:	Artigo
言語:	Inglês
出版事項:	IOP Publishing 2024-01-01
シリーズ:	Applied Physics Express
主題:	scanning probe microscopy atomic force microscopy scanning tunneling microscopy surface interface image processing
オンライン･アクセス:	https://doi.org/10.35848/1882-0786/ad2784
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