Direct Mode‐Resolved Measurement of Interfacial Phonon Transport by Acoustic Phonon Reflectometry
ABSTRACT As nanoscale devices continue to shrink in size and increase in complexity, their thermal performance becomes increasingly governed by interfacial phenomena. In particular, thermal boundary resistance (TBR) plays a critical role in controlling heat dissipation. In the conventional phonon La...
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| Asıl Yazarlar: | , , , , , , , , , |
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| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Wiley-VCH
2026-05-01
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| Seri Bilgileri: | Advanced Materials Interfaces |
| Konular: | |
| Online Erişim: | https://doi.org/10.1002/admi.202501097 |
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