Direct Mode‐Resolved Measurement of Interfacial Phonon Transport by Acoustic Phonon Reflectometry

ABSTRACT As nanoscale devices continue to shrink in size and increase in complexity, their thermal performance becomes increasingly governed by interfacial phenomena. In particular, thermal boundary resistance (TBR) plays a critical role in controlling heat dissipation. In the conventional phonon La...

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Hlavní autoři:	Christopher Hennighausen, Gustavo A. Alvarez, Jeffrey Z. Kaaret, Patrick Soucy, Amir F. Amhaz, Jeffrey Moses, Kenneth R. Beyerlein, Nicole A. Benedek, Zhiting Tian, Ankit S. Disa
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	Wiley-VCH 2026-05-01
Edice:	Advanced Materials Interfaces
Témata:	density functional theory calculations phonon transport picosecond acoustics thermal boundary resistance thermal management
On-line přístup:	https://doi.org/10.1002/admi.202501097
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