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Direct Mode‐Resolved Measurement of Interfacial Phonon Transport by Acoustic Phonon Reflectometry

ABSTRACT As nanoscale devices continue to shrink in size and increase in complexity, their thermal performance becomes increasingly governed by interfacial phenomena. In particular, thermal boundary resistance (TBR) plays a critical role in controlling heat dissipation. In the conventional phonon La...

Täydet tiedot

Tallennettuna:
Päätekijät: Christopher Hennighausen, Gustavo A. Alvarez, Jeffrey Z. Kaaret, Patrick Soucy, Amir F. Amhaz, Jeffrey Moses, Kenneth R. Beyerlein, Nicole A. Benedek, Zhiting Tian, Ankit S. Disa
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Wiley-VCH 2026-05-01
Sarja:Advanced Materials Interfaces
Aiheet:
density functional theory calculations
phonon transport
picosecond acoustics
thermal boundary resistance
thermal management
Linkit:https://doi.org/10.1002/admi.202501097
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