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Creep of Sn-0.3Ag-0.7Cu solder in electronic packaging: Experiment and simulation

In contemporary society, the growing reliance on electronic devices has necessitated the phasing out of traditional Sn–Pb solder due to its health hazards, prompting a transition to environmentally friendly, lead-free alternatives.This study aims to address the challenges of poor interfacial reliabi...

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Detaylı Bibliyografya
Asıl Yazarlar: Yuezong Zheng, Junchen Liu, Hongchao Ji, Xiaomin Huang, Wenchao Xiao, Abdullah Aziz Saad
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Elsevier 2025-01-01
Seri Bilgileri:Journal of Materials Research and Technology
Konular:
Online Erişim:http://www.sciencedirect.com/science/article/pii/S223878542402893X
Etiketler: Etiketle
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