Genetic basis of flag leaf thickness and its contribution to yield in wheat (Triticum aestivum L.)
Abstract Background Previous studies on leaf morphological traits are predominantly focused on flag leaf length (FLL), width (FLW), and area (FLA), which are known to affect light interception. However, limited research has addressed on flag leaf thickness (FLT) and its intricate relationship with v...
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| Autors principals: | , , , , , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
BMC
2025-12-01
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| Col·lecció: | BMC Plant Biology |
| Matèries: | |
| Accés en línia: | https://doi.org/10.1186/s12870-025-08014-3 |
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