Mapping QTL for Yield and Its Component Traits Using Wheat (<i>Triticum aestivum</i> L.) RIL Mapping Population from TAM 113 × Gallagher

Understanding genetic architectures of yield and yield-related traits of wheat (<i>Triticum aestivum</i> L.) grown under dryland or irrigated conditions is pivotal for developing modern high-yielding germplasm and cultivars. The objectives of this study were to detect quantitative trait loci (QTL) l...

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Hlavní autoři:	Mustafa Cerit, Zhen Wang, Mehmet Dogan, Shuhao Yu, Jorge L. Valenzuela-Antelo, Chenggen Chu, Shichen Wang, Qingwu Xue, Amir M. H. Ibrahim, Jackie C. Rudd, Richard Metz, Charles D. Johnson, Shuyu Liu
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2023-09-01
Edice:	Agronomy
Témata:	wheat quantitative trait loci yield yield components kernel traits
On-line přístup:	https://www.mdpi.com/2073-4395/13/9/2402
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