Recent advances in AI-aided TEM image analysis: Emerging trends and applications
Artificial intelligence (AI) is revolutionizing the analysis of (scanning) transmission electron microscopy ((S)TEM) data by enabling high-throughput, objective, and scalable interpretation of atomic-scale structures. Although initial AI applications often relied on large, labeled datasets and exten...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Elsevier
2026-04-01
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| Edice: | Materials & Design |
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| On-line přístup: | http://www.sciencedirect.com/science/article/pii/S026412752600273X |
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