Recent advances in AI-aided TEM image analysis: Emerging trends and applications
Artificial intelligence (AI) is revolutionizing the analysis of (scanning) transmission electron microscopy ((S)TEM) data by enabling high-throughput, objective, and scalable interpretation of atomic-scale structures. Although initial AI applications often relied on large, labeled datasets and exten...
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| Principais autores: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Elsevier
2026-04-01
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| Series: | Materials & Design |
| Assuntos: | |
| Acceso en liña: | http://www.sciencedirect.com/science/article/pii/S026412752600273X |
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