Recent advances in AI-aided TEM image analysis: Emerging trends and applications

Artificial intelligence (AI) is revolutionizing the analysis of (scanning) transmission electron microscopy ((S)TEM) data by enabling high-throughput, objective, and scalable interpretation of atomic-scale structures. Although initial AI applications often relied on large, labeled datasets and exten...

Popoln opis

Bibliografske podrobnosti

Principais autores:	Woonbae Sohn, Hionsuck Baik, Hyojung Kim
Format:	Artigo
Jezik:	Inglês
Izdano:	Elsevier 2026-04-01
Serija:	Materials & Design
Teme:	Transmission electron microscopy (TEM) Artificial intelligence (AI) Machine learning Deep learning
Online dostop:	http://www.sciencedirect.com/science/article/pii/S026412752600273X
Oznake:	Označite Brez oznak, prvi označite!