Patterned Multi-Wall Nanosheet FETs for Sustainable Scaling: Zero Gate Extension With Minimal Gate Cut Width
In nanosheet field-effect transistors (NSFETs), the scaling of the cell height (CH) is constrained by strict design rules related to gate extension (GE), gate cut (GC), and device-to-device distance. In contrast, forksheet FETs (FSFETs) enable aggressive CH reduction by introducing a dielectric wall...
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| Hoofdauteurs: | , , , , , , , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
IEEE
2025-01-01
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| Reeks: | IEEE Access |
| Onderwerpen: | |
| Online toegang: | https://ieeexplore.ieee.org/document/11021571/ |
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