Growth and characterization of novel Ir1–xCrxO2 thin films

Novel Ir1–xCrxO2 thin films have been prepared by reactive co–sputtering deposition. Composition, structure and electric and magnetic behavior have been analyzed by different techniques including EDX, XRR, XRD, SQUID magnetometry, electrical resistivity and XANES and XMCD spectroscopies. Despite the...

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Bibliografiske detaljer

Principais autores:	E. Arias-Egido, M.A. Laguna-Marco, C. Piquer, J. Chaboy, G. Fabbris, D. Haskel
Format:	Artigo
Sprog:	Inglês
Udgivet:	Elsevier 2020-11-01
Serier:	Materials & Design
Fag:	Magnetic thin films XMCD Spintronics Transition metal oxides Spin–orbit coupling
Online adgang:	http://www.sciencedirect.com/science/article/pii/S0264127520306183
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