Growth and characterization of novel Ir1–xCrxO2 thin films

Novel Ir1–xCrxO2 thin films have been prepared by reactive co–sputtering deposition. Composition, structure and electric and magnetic behavior have been analyzed by different techniques including EDX, XRR, XRD, SQUID magnetometry, electrical resistivity and XANES and XMCD spectroscopies. Despite the...

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Bibliographic Details

Main Authors:	E. Arias-Egido, M.A. Laguna-Marco, C. Piquer, J. Chaboy, G. Fabbris, D. Haskel
Format:	Artigo
Language:	Inglês
Published:	Elsevier 2020-11-01
Series:	Materials & Design
Subjects:	Magnetic thin films XMCD Spintronics Transition metal oxides Spin–orbit coupling
Online Access:	http://www.sciencedirect.com/science/article/pii/S0264127520306183
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