Growth and characterization of novel Ir1–xCrxO2 thin films
Novel Ir1–xCrxO2 thin films have been prepared by reactive co–sputtering deposition. Composition, structure and electric and magnetic behavior have been analyzed by different techniques including EDX, XRR, XRD, SQUID magnetometry, electrical resistivity and XANES and XMCD spectroscopies. Despite the...
Guardat en:
| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Elsevier
2020-11-01
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| Col·lecció: | Materials & Design |
| Matèries: | |
| Accés en línia: | http://www.sciencedirect.com/science/article/pii/S0264127520306183 |
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