Determination of Thermal Damage Threshold in THz Photomixers Using Raman Spectroscopy

The increase of device lifetime and reliability of THz photomixers will play an essential role in their possible future application. Therefore, their optimal work conditions/operation range, i.e., the maximal incident optical power should be experimentally estimated. We fabricated and tested THz pho...

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Hlavní autoři:	Martin Mikulics, Roman Adam, Genyu Chen, Debamitra Chakraborty, Jing Cheng, Anthony Pericolo, Ivan Komissarov, Daniel E. Bürgler, Sarah F. Heidtfeld, John Serafini, Stefan Preble, Roman Sobolewski, Claus M. Schneider, Joachim Mayer, Hilde H. Hardtdegen
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2023-08-01
Edice:	Crystals
Témata:	THz photomixer Raman spectroscopy device lifetime and reliability nitrogen-implanted GaAs Bragg mirror
On-line přístup:	https://www.mdpi.com/2073-4352/13/8/1267
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