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Determination of Thermal Damage Threshold in THz Photomixers Using Raman Spectroscopy

The increase of device lifetime and reliability of THz photomixers will play an essential role in their possible future application. Therefore, their optimal work conditions/operation range, i.e., the maximal incident optical power should be experimentally estimated. We fabricated and tested THz pho...

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Principais autores: Martin Mikulics, Roman Adam, Genyu Chen, Debamitra Chakraborty, Jing Cheng, Anthony Pericolo, Ivan Komissarov, Daniel E. Bürgler, Sarah F. Heidtfeld, John Serafini, Stefan Preble, Roman Sobolewski, Claus M. Schneider, Joachim Mayer, Hilde H. Hardtdegen
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI AG 2023-08-01
coleção:Crystals
Assuntos:
THz photomixer
Raman spectroscopy
device lifetime and reliability
nitrogen-implanted GaAs
Bragg mirror
Acesso em linha:https://www.mdpi.com/2073-4352/13/8/1267
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