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Effects of Carbon Incorporation on Electrical Characteristics and Thermal Stability of Ti/TiO<sub>2</sub>/<italic>n</italic>-Ge MIS Contact

The effects of carbon incorporation on the thermal stability of the interfacial TiO<sub>2</sub> layer and the electrical characteristics of Ti/TiO<sub>2</sub>/ <italic>n-</italic>Ge contacts were investigated. The improved thermal stability and contact characteristics of Ti/TiO<sub>2</sub>/ <italic>...

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Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Iksoo Park, Seonghwan Shin, Jungsik Kim, Bo Jin, Jeong-Soo Lee
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: IEEE 2022-01-01
Saila:IEEE Access
Gaiak:
Sarrera elektronikoa:https://ieeexplore.ieee.org/document/9853537/
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