Experimental Characterization of Fault-Tolerant Circuits in Small-Scale Quantum Processors
Experiments conducted on open-access cloud-based IBM Quantum devices are presented for characterizing their fault tolerance using [4, 2, 2]-encoded gate sequences. Up to 100 logical gates are activated in the <italic>Ibmq_Bogota</italic> and <italic>Ibmq_Santiago</italic>...
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| Principais autores: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Assuntos: | |
| Acceso en liña: | https://ieeexplore.ieee.org/document/9638646/ |
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