Experimental Characterization of Fault-Tolerant Circuits in Small-Scale Quantum Processors
Experiments conducted on open-access cloud-based IBM Quantum devices are presented for characterizing their fault tolerance using [4, 2, 2]-encoded gate sequences. Up to 100 logical gates are activated in the <italic>Ibmq_Bogota</italic> and <italic>Ibmq_Santiago</italic>...
I tiakina i:
| Ngā kaituhi matua: | , , , |
|---|---|
| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
IEEE
2021-01-01
|
| Rangatū: | IEEE Access |
| Ngā marau: | |
| Urunga tuihono: | https://ieeexplore.ieee.org/document/9638646/ |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|