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Vacuum frequency measurement of 7S3-7P4 transition in Cr atoms using laser-induced fluorescence

The nanometric length traceability chain is the foundation of cutting-edge research at the nanoscale. The current traceability chain has limitations in its applications. However, the application performance of the nanometric traceability chain based on the ^7 S _3 - ^7 P _4 transition in chromium at...

Πλήρης περιγραφή

Αποθηκεύτηκε σε:
Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Tong Zhou, Xiao Deng, Zhijun Yin, Guangxu Xiao, Junyu Shen, Lei Sun, Fangsheng Ren, Dongbai Xue, Yuying Xie, Jing Yu, Ming Kong, Jianbo Wang, Cong Yin, Xinbin Cheng, Tongbao Li
Μορφή: Artigo
Γλώσσα:Inglês
Έκδοση: IOP Publishing 2024-01-01
Σειρά:Applied Physics Express
Διαθέσιμο Online:https://doi.org/10.35848/1882-0786/ad9702
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