STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
In this paper, symmetrical CMOS OTA degradation is investigated with using statistical methods. OTA’ s are degraded using 4155 parameter analyzer and output current change is observed. An appopriate fitting curve is realised with MATLAB programme by taking into consedaration the error. Lifetime of t...
Sábháilte in:
| Príomhchruthaitheoirí: | , , |
|---|---|
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe / Cruthaithe: |
İstanbul University-Cerrahpasa
2008-03-01
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| Sraith: | Electrica |
| Ábhair: | |
| Rochtain ar líne: | https://electricajournal.org/index.php/pub/article/view/316 |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
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