STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
In this paper, symmetrical CMOS OTA degradation is investigated with using statistical methods. OTA’ s are degraded using 4155 parameter analyzer and output current change is observed. An appopriate fitting curve is realised with MATLAB programme by taking into consedaration the error. Lifetime of t...
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| Главные авторы: | , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
İstanbul University-Cerrahpasa
2008-03-01
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| Серии: | Electrica |
| Предметы: | |
| Online-ссылка: | https://electricajournal.org/index.php/pub/article/view/316 |
| Метки: |
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