Uncovering yield-related traits loci in Chinese wheat landraces using GWAS

The genetic basis of wheat yield is highly complex, being collectively influenced by key traits such as plant morphology, spike structure, and grain morphology. Therefore, exploring the genetic regulatory mechanisms underlying yield-related traits is crucial for breeding high-yield wheat varieties....

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Detalhes bibliográficos

Principais autores:	Ying Guo, Zhe Zhang, Rui He, Rui Ma, Fangping Yang, Lijun Zhang, Zongbing Zhan, Na Liu, Caixia Lan, Bin Bai
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Frontiers Media S.A. 2026-06-01
coleção:	Frontiers in Plant Science
Assuntos:	candidate gene elite haplotype genome-wide association analysis spikelet trait thousand-kernel weight wheat landrace
Acesso em linha:	https://www.frontiersin.org/articles/10.3389/fpls.2026.1838087/full
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