Uncovering yield-related traits loci in Chinese wheat landraces using GWAS
The genetic basis of wheat yield is highly complex, being collectively influenced by key traits such as plant morphology, spike structure, and grain morphology. Therefore, exploring the genetic regulatory mechanisms underlying yield-related traits is crucial for breeding high-yield wheat varieties....
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| Автори: | , , , , , , , , , |
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| Формат: | Artigo |
| Мова: | Inglês |
| Опубліковано: |
Frontiers Media S.A.
2026-06-01
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| Серія: | Frontiers in Plant Science |
| Предмети: | |
| Онлайн доступ: | https://www.frontiersin.org/articles/10.3389/fpls.2026.1838087/full |
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