Transparent Memory Tests Based on the Double Address Sequences
An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, net...
में बचाया:
| मुख्य लेखकों: | , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
MDPI AG
2021-07-01
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| श्रृंखला: | Entropy |
| विषय: | |
| ऑनलाइन पहुंच: | https://www.mdpi.com/1099-4300/23/7/894 |
| टैग: |
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