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Strain-induced degradation and recovery of flexible NbOx-based threshold switching device

Abstract We investigate the functionality of NbOx-based selector devices on a flexible substrate. It was observed that the failure mechanism of cyclic tensile strain is from the disruption of atom arrangements, which essentially led to the crack formation of the film. When under cyclic compressive s...

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Autors principals: Jia Min Ang, Putu Andhita Dananjaya, Calvin Ching Ian Ang, Gerard Joseph Lim, Wen Siang Lew
Format: Artigo
Idioma:Inglês
Publicat: Nature Portfolio 2023-09-01
Col·lecció:Scientific Reports
Accés en línia:https://doi.org/10.1038/s41598-023-43192-w
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