Strain-induced degradation and recovery of flexible NbOx-based threshold switching device
Abstract We investigate the functionality of NbOx-based selector devices on a flexible substrate. It was observed that the failure mechanism of cyclic tensile strain is from the disruption of atom arrangements, which essentially led to the crack formation of the film. When under cyclic compressive s...
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| Autors principals: | , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Portfolio
2023-09-01
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| Col·lecció: | Scientific Reports |
| Accés en línia: | https://doi.org/10.1038/s41598-023-43192-w |
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