QR koda

Strain-induced degradation and recovery of flexible NbOx-based threshold switching device

Abstract We investigate the functionality of NbOx-based selector devices on a flexible substrate. It was observed that the failure mechanism of cyclic tensile strain is from the disruption of atom arrangements, which essentially led to the crack formation of the film. When under cyclic compressive s...

Popoln opis

Shranjeno v:
Bibliografske podrobnosti
Principais autores: Jia Min Ang, Putu Andhita Dananjaya, Calvin Ching Ian Ang, Gerard Joseph Lim, Wen Siang Lew
Format: Artigo
Jezik:Inglês
Izdano: Nature Portfolio 2023-09-01
Serija:Scientific Reports
Online dostop:https://doi.org/10.1038/s41598-023-43192-w
Oznake: Označite
Brez oznak, prvi označite!