Anisotropic Resistive Switching in NiO Thin Films Deposited on Stepped MgO Substrates
Thin films of nickel oxide (NiO) were deposited on a 5° miscut magnesium oxide (MgO)(100) substrate using electron-beam evaporation to pursue morphology-directed resistive switching. The atomic force microscope (AFM) confirmed a stepped surface with a terrace width of ~85 nm and a step height of ~7...
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| Главные авторы: | , , , , , , , , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
MDPI AG
2025-11-01
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| Серии: | Nanomaterials |
| Предметы: | |
| Online-ссылка: | https://www.mdpi.com/2079-4991/15/22/1703 |
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