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In Situ Study on Cu-to-Cu Thermal Compression Bonding

Cu-to-Cu thermal compression bonding (TCB) has emerged as a promising solution for ultrafine pitch packaging in 3D integrated circuit technologies. Despite the progress made by conventional Cu-to-Cu TCB methods in achieving good mechanical strength of the Cu bonds, the bonding processes generally re...

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Autors principals: Tongjun Niu, Ke Xu, Chao Shen, Tianyi Sun, Justin Oberst, Carol A. Handwerker, Ganesh Subbarayan, Haiyan Wang, Xinghang Zhang
Format: Artigo
Idioma:Inglês
Publicat: MDPI AG 2023-06-01
Col·lecció:Crystals
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Accés en línia:https://www.mdpi.com/2073-4352/13/7/989
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