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Removal Characteristics of Sapphire Lapping using Composite Plates with Consciously Patterned Resinoid-Bonded Semifixed Diamond Grits

Sapphire lapping is of key importance for the successful planarization of wafers that are widely present in electronic devices. However, the high hardness of sapphire makes it extremely challenging to improve its material removal rate during the lapping process without compromising surface quality a...

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Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Wenshan Wang, Yiqing Yu, Zhongwei Hu, Congfu Fang, Jing Lu, Xipeng Xu
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: MDPI AG 2020-04-01
Saila:Crystals
Gaiak:
Sarrera elektronikoa:https://www.mdpi.com/2073-4352/10/4/293
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