Código QR (código de barras bidimensional)

Removal Characteristics of Sapphire Lapping using Composite Plates with Consciously Patterned Resinoid-Bonded Semifixed Diamond Grits

Sapphire lapping is of key importance for the successful planarization of wafers that are widely present in electronic devices. However, the high hardness of sapphire makes it extremely challenging to improve its material removal rate during the lapping process without compromising surface quality a...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Principais autores: Wenshan Wang, Yiqing Yu, Zhongwei Hu, Congfu Fang, Jing Lu, Xipeng Xu
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI AG 2020-04-01
coleção:Crystals
Assuntos:
Acesso em linha:https://www.mdpi.com/2073-4352/10/4/293
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!